Prediction of Vacuum Pump Degradation in Semiconductor Processing
نویسندگان
چکیده
منابع مشابه
Prediction of Vacuum Pump Degradation in Semiconductor Processing
This paper addresses the issue of vacuum pump degradation in semiconductor manufacturing. The ability to identify the current level of vacuum pump degradation and predict the Remaining-Useful-Life (RUL) of a dry vacuum pump would allow manufacturers to schedule pump swaps at convenient times, and reduce the instances of unexpected pump failures, which can incur significant costs. In this paper,...
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ژورنال
عنوان ژورنال: IFAC Proceedings Volumes
سال: 2009
ISSN: 1474-6670
DOI: 10.3182/20090630-4-es-2003.00267